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  1. Optiwave Systems Inc. - Your Provider of Optical Design Software for the Photonics Industry

    Optiwave systems develops optical design software for various industries such as fiber optics, photonics, fiber optic components, photonic band gap, etc. Our ...
    computer aided design1
    photonics1
    aided1
    microelectronics1
    DRC1
    optical design1
    electronic design automation1
    IC design1
    design automation1
    MMIC1
    RFIC1
    GDSII1
    microfabrication1
    optical systems1
    optical design software1
    optical system design1
    computer assisted design1
    pixel design1
    optical grating1
    physical verification1
    optical waveguide design1
    photonic band gap1
    planar waveguide1
    FDTD design1
    FDTD simulation1
    FDTD software1
    mask preparation software1
    optical communication design1
    PBG design1
    physical layout software1
    pixel simulation1

    www.optispice.com - 2009-02-08

  2. EDA Today

    Market research and consulting for the worldwide Electronic Design Automation (EDA) industry. Rita Glover, Principal Analyst.
    CAE2
    EDA1
    PCB design1
    Electronic Design Automation1
    ECAD1
    IC design1
    EDA tools1
    semiconductor design1
    EDA industry1
    EDA analyst1
    EDA consultant1
    EDA market data1
    EDA market research1

    www.edat.com - 2009-02-12

  3. DFT Digest: Expanding design-for-test in an ever-shring world…

    Design for test, Design-for-Test (DFT) discussion, education, and best-practices, including Scan, ATPG, BIST, Memory BIST, Logic BIST, Test Compression, ...
    test3
    scan2
    compression2
    semiconductors2
    eda1
    ate1
    fault1
    vlsi1
    dfm1
    dft1
    electronic design automation1
    ic design1
    automatic test equipment1
    testability1
    design for manufacture1
    design for test1
    manufacturability1
    design for testability1
    best-practices1
    atpg1
    design-for-testability1
    design-for-test1
    at-speed test1
    fault coverage1
    transition fault1
    delay fault1
    ibist1
    logic bist1
    memory bist1
    nanometer design1
    test compression1

    www.dftdigest.com - 2009-02-08

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